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TA-L2: Image Quality Assessment II

Session Type: Lecture
Time: Tuesday, October 14, 08:30 - 11:30
Location: Room 1B
Session Chair: Zhigang (Zeke) Fan , Xerox
 
  TA-L2.1: AN IMAGE QUALITY ASSESSMENT METRIC BASED CONTOURLET
         Wen Lu; Xidian University
         Xinbo Gao; Xidian University
         Xuelong Li; University of London
         Dacheng Tao; Hong Kong Polytechnic University
 
  TA-L2.2: MEASURING THE GLOBAL PHASE COHERENCE OF AN IMAGE
         Gwendoline Blanchet; Centre National d'Etudes Spatiales (CNES)
         Lionel Moisan; Université Paris Descartes
         Bernard Rouge; Centre National d'Etudes Spatiales (CNES)
 
  TA-L2.3: WHICH SEMI-LOCAL VISUAL MASKING MODEL FOR WAVELET BASED IMAGE QUALITY METRIC?
         Alexandre Ninassi; Thomson Corporate Research
         Olivier Le Meur; Thomson Corporate Research
         Patrick Le Callet; IRCCyN UMR 6597 CNRS
         Dominique Barba; IRCCyN UMR 6597 CNRS
 
  TA-L2.4: A NO-REFERENCE SPATIAL ALIASING MEASURE FOR DIGITAL IMAGE RESIZING
         Amy Reibman; AT&T Labs - Research
         Shan Suthaharan; University of North Carolina at Greensboro
 
  TA-L2.5: UNDERSTANDING AND SIMPLIFYING THE STRUCTURAL SIMILARITY METRIC
         David Rouse; Cornell University
         Sheila Hemami; Cornell University
 
  TA-L2.6: GENERAL-PURPOSE REDUCED-REFERENCE IMAGE QUALITY ASSESSMENT BASED ON PERCEPTUALLY AND STATISTICALLY MOTIVATED IMAGE REPRESENTATION
         Qiang Li; University of Texas at Arlington
         Zhou Wang; University of Waterloo
 
  TA-L2.7: STRUCTURAL TEXTURE SIMILARITY METRICS FOR RETRIEVAL APPLICATIONS
         Xiaonan Zhao; Northwestern University
         Matthew Reyes; University of Michigan
         Thrasyvoulos Pappas; Northwestern University
         David Neuhoff; University of Michigan
 
  TA-L2.8: UNIFYING ANALYSIS OF FULL REFERENCE IMAGE QUALITY ASSESSMENT
         Kalpana Seshadrinathan; University of Texas at Austin
         Alan Bovik; University of Texas at Austin